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DFT (Design- for-Test) plays a key role in
manufacturing test, especially as SoC design becomes more prevalent
and complex. The main purposes of DFT are enhancing product quality,
reducing cost of testing and improving productivity. This document
is the information to customers which contains what DFT service we
do and what we need from customers for this service. Our DFT service
is to create tests for detecting defects in manufacturing and we provide
logic test solutions and test synthesis and DFT analysis. The methodologies
we adopt for IC manufacturing test are scan and ATPG which offer high
fault coverage and less impact on design. The main fault model we
use is stuck-at fault which is the most common fault model, and our
mission is to reach the highest test and fault coverage
Note : Alliance with SynTest for Insert Scan Chain,
ATPG, Memory BIST and JTAG |
